37 search results - page 5 / 8 » Timing analysis in presence of supply voltage and temperatur... |
DAC
2006
ACM
14 years 7 months ago
2006
ACM
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
DAC
2009
ACM
14 years 7 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
BMCBI
2008
13 years 6 months ago
2008
Background: In addition to their use in detecting undesired real-time PCR products, melting temperatures are useful for detecting variations in the desired target sequences. Metho...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...