266 search results - page 3 / 54 » Timing yield estimation using statistical static timing anal... |
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
DATE
2010
IEEE
13 years 8 months ago
2010
IEEE
—The advanced sampling and variance reduction techniques as efficient alternatives to the slow crude-MC method have recently been adopted for the analysis of timing yield in dig...
ISPD
2000
ACM
14 years 27 days ago
2000
ACM
We propose a gate resizing method for delay and power optimization that is based on statistical static timing analysis. Our method focuses on the component of timing uncertainties...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
ICCD
2007
IEEE
14 years 5 months ago
2007
IEEE
We have developed a new statistical timing analysis approach that does not impose any assumptions on the nature of manufacturing variability and takes into account an arbitrary mo...