282 search results - page 37 / 57 » Transient Fault Detectors |
MICRO
2003
IEEE
14 years 24 days ago
2003
IEEE
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
HPCA
2009
IEEE
14 years 8 months ago
2009
IEEE
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make modern processors highly vulnerable to transient faults. Architectural Vulnerabil...
IEEEPACT
2008
IEEE
14 years 1 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
TMM
2010
13 years 2 months ago
2010
A framework is presented which addresses the issues related to the real-time implementation of synchronized video and audio time-scale and pitch-scale modification algorithms. It a...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...