In this paper the consolidate identification of faults, distinguished as transient or permanent/intermittent, is approached. Transient faults discrimination has long been performe...
Andrea Bondavalli, Silvano Chiaradonna, Felicita D...
The progression of implementation technologies into the sub-100 nanometer lithographies renew the importance of understanding and protecting against single-event upsets in digital...
Nicholas J. Wang, Justin Quek, Todd M. Rafacz, San...
This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transie...
Ramtilak Vemu, Abhijit Jas, Jacob A. Abraham, Srin...
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...