282 search results - page 9 / 57 » Transient Fault Detectors |
IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
The general approach to fault tolerance in uniprocessor systems is to maintain enough time redundancy in the schedule so that any task instance can be re-executed in presence of f...
HPCA
2007
IEEE
14 years 1 months ago
2007
IEEE
Fault screeners are a new breed of fault identification technique that can probabilistically detect if a transient fault has affected the state of a processor. We demonstrate that...
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
Abstract—Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Aut...
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Voted
DSD
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--Recent technology trends have made radiationinduced soft errors a growing threat to the reliability of microprocessors, a problem previously only known to the aerospace i...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...