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» Two efficient methods to reduce power and testing time
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DATE
2007
IEEE
81views Hardware» more  DATE 2007»
14 years 2 months ago
Using the inter- and intra-switch regularity in NoC switch testing
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabed...
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
14 years 2 months ago
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...
Alexandre M. Amory, Marcelo Lubaszewski, Fernando ...
VLDB
2007
ACM
197views Database» more  VLDB 2007»
14 years 8 months ago
Indexable PLA for Efficient Similarity Search
Similarity-based search over time-series databases has been a hot research topic for a long history, which is widely used in many applications, including multimedia retrieval, dat...
Qiuxia Chen, Lei Chen 0002, Xiang Lian, Yunhao Liu...
ISQED
2003
IEEE
85views Hardware» more  ISQED 2003»
14 years 1 months ago
Static Pin Mapping and SOC Test Scheduling for Cores with Multiple Test Sets
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanja...
ICCD
2008
IEEE
136views Hardware» more  ICCD 2008»
14 years 5 months ago
A resource efficient content inspection system for next generation Smart NICs
— The aggregate power consumption of the Internet is increasing at an alarming rate, due in part to the rapid increase in the number of connected edge devices such as desktop PCs...
Karthik Sabhanatarajan, Ann Gordon-Ross