— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnost...
Several systems have been presented in the last years in order to manage the complexity of large microarray experiments. Although good results have been achieved, most systems ten...
Ivan Porro, Livia Torterolo, Luca Corradi, Marco F...
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
Continuous scaling of VLSI circuits is reducing gate delays but rapidly increasing interconnect delays. Semiconductor Industry Association (SIA) roadmap predicts that, beyond the ...
Shukri J. Souri, Kaustav Banerjee, Amit Mehrotra, ...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...