4116 search results - page 110 / 824 » Type Analysis for CHIP |
DELTA
2006
IEEE
14 years 2 months ago
2006
IEEE
— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnost...
BMCBI
2007
13 years 8 months ago
2007
Several systems have been presented in the last years in order to manage the complexity of large microarray experiments. Although good results have been achieved, most systems ten...
DAC
2005
ACM
14 years 9 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
DAC
2000
ACM
14 years 9 months ago
2000
ACM
Continuous scaling of VLSI circuits is reducing gate delays but rapidly increasing interconnect delays. Semiconductor Industry Association (SIA) roadmap predicts that, beyond the ...
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...