4116 search results - page 122 / 824 » Type Analysis for CHIP |
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overc...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
EURODAC
1994
IEEE
14 years 1 months ago
1994
IEEE
of a direct implementation of this criterion. This paper presents the first critical path finding tool based on the exact criterion. It offers therefore better results in compariso...
APNOMS
2006
Springer
14 years 19 days ago
2006
Springer
This paper intends to introduce the development of a terminal agent for QoS measurement that is suitable for an NGN environment, and to summarize the results of its performance tes...
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
The capability of predicting the temperature profile is critically important for timing estimation, leakage reduction, power estimation, hotspot avoidance and reliability concerns ...