Abstract—Silicon debug poses a unique challenge to the engineer because of the limited access to internal signals of the chip. Embedded hardware such as trace buffers helps overc...
Yu-Shen Yang, Brian Keng, Nicola Nicolici, Andreas...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
of a direct implementation of this criterion. This paper presents the first critical path finding tool based on the exact criterion. It offers therefore better results in compariso...
This paper intends to introduce the development of a terminal agent for QoS measurement that is suitable for an NGN environment, and to summarize the results of its performance tes...
ChinChol Kim, SangChul Shin, Sang Yong Ha, SunYoun...
The capability of predicting the temperature profile is critically important for timing estimation, leakage reduction, power estimation, hotspot avoidance and reliability concerns ...