1951 search results - page 269 / 391 » UML-Based integration testing |
102
Voted
EUROGRAPHICS
2010
Eurographics
15 years 11 months ago
2010
Eurographics
We introduce an approach to visualize stationary 2D vector fields with global uncertainty obtained by considering the transport of local uncertainty in the flow. For this, we ex...
138
Voted
ICCD
2006
IEEE
15 years 11 months ago
2006
IEEE
—Field-Programmable Gate Array (FPGA) technology is characterized by continuous improvements that provide new opportunities in system design. Multiprocessors-ona-Programmable-Chi...
117
click to vote
ICCAD
2008
IEEE
15 years 11 months ago
2008
IEEE
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
132
Voted
ICCAD
2006
IEEE
15 years 11 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
91
Voted
ICCAD
2002
IEEE
15 years 11 months ago
2002
IEEE
Abstract—A robust, efficient, and accurate inductance extraction and simulation tool, INDUCTWISE, is developed and described in this paper. This work advances the state-of-the-ar...