1951 search results - page 31 / 391 » UML-Based integration testing |
351
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ATS
2010
IEEE
15 years 4 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
176
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
176
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ET
2002
15 years 6 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
140
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ITC
2003
IEEE
16 years 4 days ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
208
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GG
2008
Springer
15 years 8 months ago
2008
Springer
The model-driven development of model transformations requires both a technique to model model transformations as well as a means to transform transformation models. Therefore, t...