872 search results - page 55 / 175 » UML-based design test generation |
127
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ACMSE
2004
ACM
15 years 9 months ago
2004
ACM
This paper presents a specification-driven approach to test automation for GUI-based JAVA programs as an alternative to the use of capture/replay. The NetBeans Jemmy library provi...
145
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DAC
2000
ACM
16 years 5 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
153
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DATE
1999
IEEE
15 years 8 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
127
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EMSOFT
2005
Springer
15 years 9 months ago
2005
Springer
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...
147
Voted
VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...