52 search results - page 7 / 11 » Use case-based testing of product lines |
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
TASE
2011
IEEE
13 years 2 months ago
2011
IEEE
—For multiclass flow line models, we identify a class of service times that allow a decomposition of the system into subsets of servers called channels. In each channel, the cus...
VAMOS
2010
Springer
13 years 9 months ago
2010
Springer
Abstract--For two decades, feature diagrams have been intensively studied as a means to specify variability and pilot configuration in software product line engineering. Surprising...
VAMOS
2009
Springer
14 years 2 months ago
2009
Springer
In software product line engineering, feature models enable to automate the generation of productspecific models in conjunction with domain “base models” (e.g. UML models). T...
IQ
2007
13 years 9 months ago
2007
: Motivated by the problem of out-of-shelf (OOS) in retail industry and the emergence of RFID (Radio Frequency Identification) technology, this paper investigates the impact that t...