112 search results - page 22 / 23 » Use of local biasing in designing analog integrated circuits |
DAC
2010
ACM
13 years 10 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
CIMCA
2005
IEEE
14 years 15 days ago
2005
IEEE
Minimal Switching Graph (MSG) is a graphical model for the constrained via minimization problem — a combinatorial optimization problem in integrated circuit design automation. F...
DAC
2005
ACM
13 years 8 months ago
2005
ACM
This paper proposes a fast decoupling capacitance (decap) allocation and budgeting algorithm for both early stage decap estimation and later stage decap minimization in today’s ...
FPGA
2005
ACM
14 years 13 days ago
2005
ACM
Floating-point Sparse Matrix-Vector Multiplication (SpMXV) is a key computational kernel in scientific and engineering applications. The poor data locality of sparse matrices sig...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...