116 search results - page 2 / 24 » Using Logic Models To Predict The Detection Behavior Of Stat... |
VTS
2000
IEEE
13 years 11 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
WOSS
2004
ACM
14 years 9 days ago
2004
ACM
Complex distributed Internet services form the basis not only of e-commerce but increasingly of mission-critical networkbased applications. What is new is that the workload and in...
BMCBI
2007
13 years 6 months ago
2007
Background: High-throughput peptide and protein identification technologies have benefited tremendously from strategies based on tandem mass spectrometry (MS/MS) in combination wi...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
ICCAD
2003
IEEE
14 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...