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» Using embedded FPGAs for SoC yield improvement
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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 1 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
CSREAESA
2006
13 years 8 months ago
Java Flowpaths: Efficiently Generating Circuits for Embedded Systems from Java
The performance of software executed on a microprocessor is adversely affected by the basic fetchexecute cycle. A further performance penalty results from the load-execute-store p...
Darrin M. Hanna, Michael DuChene, Girma S. Tewolde...
FPL
2010
Springer
124views Hardware» more  FPL 2010»
13 years 5 months ago
Finding System-Level Information and Analyzing Its Correlation to FPGA Placement
One of the more popular placement algorithms for Field Programmable Gate Arrays (FPGAs) is called Simulated Annealing (SA). This algorithm tries to create a good quality placement ...
Farnaz Gharibian, Lesley Shannon, Peter Jamieson
DAC
2005
ACM
13 years 9 months ago
Multi-frequency wrapper design and optimization for embedded cores under average power constraints
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
Qiang Xu, Nicola Nicolici, Krishnendu Chakrabarty
MICRO
2007
IEEE
188views Hardware» more  MICRO 2007»
14 years 1 months ago
Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
Jangwoo Kim, Nikos Hardavellas, Ken Mai, Babak Fal...