12 search results - page 2 / 3 » Using multi-threshold threshold gates in RTD-based logic des... |
GECCO
2004
Springer
14 years 22 days ago
2004
Springer
This article summarizes two experiments utilizing building blocks to find analog electronic circuits on a CMOS Field Programmable Transistor Array (FPTA). The FPTA features 256 pr...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Addressing both standby and active power is a major challenge in developing System-on-Chip designs for batterypowered products. Powering off sections of logic or memorie...
SBCCI
2004
ACM
14 years 23 days ago
2004
ACM
This paper presents an approach for simulation of mixed analog-digital CMOS integrated circuits, aiming at estimating crosstalk effects due to current pulses drawn from voltage s...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...