226 search results - page 25 / 46 » Variation-tolerant circuits: circuit solutions and technique... |
DAC
2005
ACM
13 years 10 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
CODES
2010
IEEE
13 years 6 months ago
2010
IEEE
With the continuous scaling of semiconductor technology, the life-time of circuit is decreasing so that processor failure becomes an important issue in MPSoC design. A software so...
FCCM
1999
IEEE
14 years 22 days ago
1999
IEEE
The time it takes to reconfigure FPGAs can be a significant overhead for reconfigurable computing. In this paper we develop new compression algorithms for FPGA configurations that...
ITC
2002
IEEE
14 years 1 months ago
2002
IEEE
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...
ISQED
2006
IEEE
14 years 2 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...