Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
Hongliang Chang, Vladimir Zolotov, Sambasivan Nara...
With the continuous scaling of semiconductor technology, the life-time of circuit is decreasing so that processor failure becomes an important issue in MPSoC design. A software so...
Chanhee Lee, Hokeun Kim, Hae-woo Park, Sungchan Ki...
The time it takes to reconfigure FPGAs can be a significant overhead for reconfigurable computing. In this paper we develop new compression algorithms for FPGA configurations that...
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...
Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Tak...
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...