1585 search results - page 38 / 317 » Variational Analysis of Pseudospectra |
DAC
2010
ACM
13 years 11 months ago
2010
ACM
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...
SIGIR
2008
ACM
13 years 7 months ago
2008
ACM
In most previous work on personalized search algorithms, the results for all queries are personalized in the same manner. However, as we show in this paper, there is a lot of vari...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract— Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. ...
ISQED
2008
IEEE
14 years 2 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...