1585 search results - page 70 / 317 » Variational Analysis of Pseudospectra |
ICCAD
2008
IEEE
14 years 7 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
ICCAD
2004
IEEE
14 years 7 months ago
2004
IEEE
A latch-based timing analyzer is an essential tool for developing high-speed pipeline designs. As process variations increasingly influence the timing characteristics of DSM desi...
ASPDAC
2009
ACM
14 years 4 months ago
2009
ACM
In this paper, we present a novel statistical full-chip leakage power analysis method. The new method can provide a general framework to derive the full-chip leakage current or po...
WACV
2008
IEEE
14 years 4 months ago
2008
IEEE
In recent years, many researchers are studying object categorization problem. It is reported that bag of keypoints approach which is based on local features without topological in...
DATE
2007
IEEE
14 years 4 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...