— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. In the presence of process variations, wo...
In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
Independent component analysis (ICA) is possibly the most widespread approach to solve the blind source separation (BSS) problem. Many different algorithms have been proposed, tog...
Jarkko Ylipaavalniemi, Nima Reyhani, Ricardo Vig&a...
Blind source separation (BSS) is a process to reconstruct source signals from the mixed signals. The standard BSS methods assume a fixed set of stationary source signals with the ...
This paper presents a method for allocating production capacity among flexible and dedicated machines based on uncertain demand forecasts of products in a production portfolio. Gi...