1093 search results - page 127 / 219 » Verifying VLSI Circuits |
SBCCI
2004
ACM
14 years 2 months ago
2004
ACM
This paper presents a design methodology for RF CMOS Low Noise Amplifiers (LNA). This methodology uses a current–based MOSFET model, which allows a detailed analysis of an LNA f...
ISMVL
2003
IEEE
14 years 2 months ago
2003
IEEE
A new multiple-valued current-mode (MVCM) integrated circuit based on dynamic source-coupled logic (SCL) is proposed for low-power VLSI applications. The use of a precharge-evalua...
VTS
2002
IEEE
14 years 1 months ago
2002
IEEE
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...
ISLPED
2000
ACM
14 years 1 months ago
2000
ACM
Recovering and reusing circuit energies that would otherwise be dissipated as heat can reduce the power dissipated by a VLSI chip. To accomplish this requires a power source that ...
EVOW
1999
Springer
14 years 1 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...