1093 search results - page 187 / 219 » Verifying VLSI Circuits |
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
In this paper, we propose the first wire density driven global routing that considers CMP variation and timing. To enable CMP awareness during global routing, we propose a compac...
ICCAD
2001
IEEE
14 years 5 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
ISPD
2010
ACM
14 years 3 months ago
2010
ACM
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...
ISPD
2010
ACM
14 years 3 months ago
2010
ACM
This paper presents SafeChoice (SC), a novel clustering algorithm for wirelength-driven placement. Unlike all previous approaches, SC is proposed based on a fundamental theorem, s...
ISPD
2010
ACM
14 years 3 months ago
2010
ACM
As the thermal wall becomes the dominant factor limiting VLSI circuit performance, and the interconnect wires become the primary power consumer, power efficiency of onchip data th...