1093 search results - page 22 / 219 » Verifying VLSI Circuits |
ISPD
2000
ACM
14 years 1 months ago
2000
ACM
We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
EUSFLAT
2003
13 years 10 months ago
2003
Industrial processes can be often modelled using Petri nets. If all the process variables (or events) are assumed to be twovalued signals, then it is possible to obtain a hardware...
DAC
1999
ACM
14 years 9 months ago
1999
ACM
- A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range o...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sam...
NIPS
1996
13 years 10 months ago
1996
A one-dimensional, visual tracking chip has been implemented using neuromorphic,analog VLSI techniques to modelselective visual attention in the control of saccadic and smooth pur...