We address the problem of computing critical area for missing material defects in a circuit layout. The extraction of critical area is the main computational problem in VLSI yield...
Industrial processes can be often modelled using Petri nets. If all the process variables (or events) are assumed to be twovalued signals, then it is possible to obtain a hardware...
- A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range o...
Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sam...
A one-dimensional, visual tracking chip has been implemented using neuromorphic,analog VLSI techniques to modelselective visual attention in the control of saccadic and smooth pur...
Timothy K. Horiuchi, Tonia G. Morris, Christof Koc...