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» Verifying VLSI Circuits
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EURODAC
1995
IEEE
126views VHDL» more  EURODAC 1995»
14 years 9 days ago
Quality considerations in delay fault testing
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...
Alicja Pierzynska, Slawomir Pilarski
ISCAS
2006
IEEE
120views Hardware» more  ISCAS 2006»
14 years 2 months ago
Architecture of a VLSI cellular processor array for synchronous/asynchronous image processing
— This paper describes a new architecture for a cellular processor array integrated circuit, which operates in both discreteand continuous-time domains. Asynchronous propagation ...
Alexey Lopich, Piotr Dudek
VLSID
2003
IEEE
183views VLSI» more  VLSID 2003»
14 years 9 months ago
Interconnect Delay Minimization Using a Novel Pre-Mid-Post Buffer Strategy
We consider the problem of minimizing the delay in transporting a signal across a distance in a VLSI circuit.The problem can be restated as a combined buffer insertion, buffer siz...
Vani Prasad, Madhav P. Desai
DFT
1997
IEEE
101views VLSI» more  DFT 1997»
14 years 29 days ago
Crosstalk Minimization in Three-Layer HVH Channel Routing
Crosstalk has become a major issue in VLSI design due to the high frequency, long interconnecting lines and small spacing between interconnects in today's integrated circuits...
Zhan Chen, Israel Koren
GLVLSI
2003
IEEE
161views VLSI» more  GLVLSI 2003»
14 years 2 months ago
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann