Functional decomposition is a process of splitting a complex circuit into smaller sub-circuits. This paper deals with the problem of determining the set of best free and bound var...
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
In this paper, for the first time, we analyze non-quasistatic (NQS) effects during single-event upsets (SEUs) in deep-submicron (DSM) MOS devices, using extensive 2D device, BSIM...
Palkesh Jain, D. Vinay Kumar, J. M. Vasi, Mahesh B...
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in ...
Mariam Momenzadeh, Marco Ottavi, Fabrizio Lombardi