222 search results - page 21 / 45 » Verifying an Arbiter Circuit |
IPPS
2010
IEEE
13 years 5 months ago
2010
IEEE
This paper focuses on parallelization of the classic static timing analysis (STA) algorithm for verifying timing characteristics of digital integrated circuits. Given ever-increasi...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
FMSD
2010
13 years 6 months ago
2010
In this paper, we consider verifying properties of mixed-signal circuits, i.e., circuits for which there is an interaction between analog (continuous) and digital (discrete) values...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
VLSID
2001
IEEE
14 years 8 months ago
2001
IEEE
In this paper we describe a hardware design method for memory and register arrays that allows the application of formal equivalence checking for comparing a high-level register tr...