222 search results - page 28 / 45 » Verifying an Arbiter Circuit |
DAC
2003
ACM
14 years 9 months ago
2003
ACM
Sleep transistors are effective to reduce dynamic and leakage power. The cluster-based design was proposed to reduce the sleep transistor area by clustering gates to minimize the ...
GLVLSI
2007
IEEE
14 years 2 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
ISCAS
2007
IEEE
14 years 2 months ago
2007
IEEE
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
ISCAS
2007
IEEE
14 years 2 months ago
2007
IEEE
—Piezoelectric materials have been proposed as embedded power source, which are capable of converting mechanical energy into electrical energy. However, power generated from a pi...
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...