Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
Rajarshi Mukherjee, Seda Ogrenci Memik, Gokhan Mem...
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
Modern processors rely heavily on broadcast networks to bypass instruction results to dependent instructions in the pipeline. However, as clock rates increase, architectures get w...
Karthikeyan Sankaralingam, Vincent Ajay Singh, Ste...
— Due to the multi-core processors, the importance of parallel workloads has increased considerably. However, manycore chips demand new interconnection strategies, since traditio...
Henrique Cota de Freitas, Lucas Mello Schnorr, Mar...
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...