717 search results - page 113 / 144 » Virtual Circuit Switching |
DAC
2005
ACM
14 years 9 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
ICCD
2003
IEEE
14 years 5 months ago
2003
IEEE
Modern processors rely heavily on broadcast networks to bypass instruction results to dependent instructions in the pipeline. However, as clock rates increase, architectures get w...
PDP
2010
IEEE
14 years 3 months ago
2010
IEEE
— Due to the multi-core processors, the importance of parallel workloads has increased considerably. However, manycore chips demand new interconnection strategies, since traditio...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...