42 search results - page 6 / 9 » Voltage Noise in Production Processors |
TVLSI
2002
13 years 7 months ago
2002
Switching activity-generated power-supply grid-noise presents a major obstacle to the reduction of supply voltage in future generation semiconductor technologies. A popular techniq...
CGO
2005
IEEE
14 years 1 months ago
2005
IEEE
To improve performance and reduce power, processor designers employ advances that shrink feature sizes, lower voltage levels, reduce noise margins, and increase clock rates. Howev...
DSN
2005
IEEE
14 years 1 months ago
2005
IEEE
Register files are in the critical path of most high-performance processors and their latency is one of the most important factors that limit their size. Our goal is to develop er...
ISCA
2000
IEEE
13 years 12 months ago
2000
IEEE
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardw...
TDSC
2010
13 years 5 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...