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DAC
2003
ACM
14 years 23 days ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
AGILEDC
2004
IEEE
13 years 11 months ago
Taming the Embedded Tiger - Agile Test Techniques for Embedded Software
Strong unit testing is the foundation of agile software development but embedded systems present special problems. Test of embedded software is bound up with test of hardware, cro...
Nancy Van Schooenderwoert, Ron Morsicato
CLIN
2001
13 years 9 months ago
Creating a Dutch Information Retrieval Test Corpus
This paper describes the first large-scale evaluation of information retrieval systems using Dutch documents and queries. We describe in detail the characteristics of the Dutch te...
Djoerd Hiemstra, David van Leeuwen
GLVLSI
2009
IEEE
125views VLSI» more  GLVLSI 2009»
14 years 2 months ago
Redundant wire insertion for yield improvement
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...
Jin-Tai Yan, Zhi-Wei Chen
CGI
2006
IEEE
14 years 1 months ago
Improving the Interval Ray Tracing of Implicit Surfaces
This paper presents a fast and reliable method to trim non-solution regions in an interval ray tracing process. The “trimming algorithm” uses interval analysis to perform rejec...
Jorge Flórez, Mateu Sbert, Miguel Án...