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ATS
2003
IEEE
93views Hardware» more  ATS 2003»
14 years 3 months ago
Optimal System-on-Chip Test Scheduling
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
Erik Larsson, Hideo Fujiwara
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
14 years 2 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
DAC
2004
ACM
14 years 10 months ago
Abstraction refinement by controllability and cooperativeness analysis
ion Refinement by Controllability and Cooperativeness Analysis Freddy Y.C. Mang and Pei-Hsin Ho Advanced Technology Group, Synopsys, Inc. {fmang, pho}@synopsys.com nt a new abstrac...
Freddy Y. C. Mang, Pei-Hsin Ho
CIVR
2009
Springer
169views Image Analysis» more  CIVR 2009»
14 years 4 months ago
Exploiting contextual data for event retrieval in surveillance video
Contextual information is vital for the robust extraction of semantic information in automated surveillance systems. We have developed a scene independent framework for the detect...
Philip Kelly, Ciarán O. Conaire, Noel E. O'...
EH
2003
IEEE
117views Hardware» more  EH 2003»
14 years 3 months ago
The Evolutionary Design and Synthesis of Non-Linear Digital VLSI Systems
This paper describes a multi-objective Evolutionary Algorithm (EA) system for the synthesis of efficient non-linear VLSI circuit modules. The EA takes the specification for a no...
Robert Thomson, Tughrul Arslan