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VLSID
2006
IEEE
14 years 10 months ago
2006
IEEE
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
VLSID
2006
IEEE
14 years 10 months ago
2006
IEEE
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
An important means of validating the design of commercial-grade shared memory multiprocessors is to run a large number of pseudo-random test programs on them. However, when intent...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
Allowing loads to issue out-of-order with respect to earlier unresolved store addresses is very important for extracting parallelism in large-window superscalar processors. Blindl...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...