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ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to furth...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Many of the tools and techniques used to evaluate and characterize ICs can be applied to MEMS technology. In this paper we discuss various tools and techniques used to provide str...
IJCAI
2003
13 years 11 months ago
2003
In this paper, we propose a novel method to infer the web user’s Information Content (IC), which is the information that the user must examine to complete her task. In particula...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
IMAGING
2003
13 years 11 months ago
2003
The use of an Interim Connection Space (ICS) is proposed as a means for extending the concept of device independent color management to support spectral imaging. Color management,...