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IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
Technology trends are such that single event effects (SEE)are likely to become even more of a concern for the future. Decreasing feature sizes, lower operating voltage, and higher...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
With its advantages in wirelength reduction and routing flexibility compared with Manhattan routing, X-architecture has been proposed and applied to modern IC design. As a critic...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
CIA
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. We present a trust model extension that attempts to relax the assumptions that are currently taken by the majority of existing trust models: (i) proven identity of agents...