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ASPDAC
2009
ACM
13 years 10 months ago
2009
ACM
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
As technology advances, the interconnect delay among modules plays dominant role in chip performance. Buffer insertion, as a traditional approach to reduce wire delay in 2D ICs, i...
CHES
2009
Springer
14 years 8 months ago
2009
Springer
? This paper gives an overview of the place of reverse engineering (RE) in the semiconductor industry, and the techniques used to obtain information from semiconductor products. Th...