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VTS
2005
IEEE
14 years 4 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
ISLPED
2005
ACM
14 years 4 months ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
ICCSA
2005
Springer
14 years 4 months ago
2005
Springer
Abstract. In this paper, we present a parallel tabu search (TS) algorithm for efficient optimization of a constrained multiobjective VLSI standard cell placement problem. The prima...
DSD
2005
IEEE
14 years 24 days ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
ISCA
2005
IEEE
14 years 4 months ago
2005
IEEE
Network Intrusion Detection and Prevention Systems have emerged as one of the most effective ways of providing security to those connected to the network, and at the heart of alm...