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ITC
1998
IEEE
60views Hardware» more  ITC 1998»
13 years 11 months ago
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories
Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goo...
ITC
1998
IEEE
126views Hardware» more  ITC 1998»
13 years 11 months ago
A comprehensive approach to the partial scan problem using implicit state enumeration
This paper presents a novel technique to evaluate the noncontrollability measures of state registers for partial scan design. Our model uses implicit techniques for finite state ma...
Priyank Kalla, Maciej J. Ciesielski
ITC
1998
IEEE
82views Hardware» more  ITC 1998»
13 years 11 months ago
A high speed and area efficient on-chip analog waveform extractor
ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
Ara Hajjar, Gordon W. Roberts
ITC
1998
IEEE
69views Hardware» more  ITC 1998»
13 years 11 months ago
A performance analysis system for MEMS using automated imaging methods
The ability to make in-situ performance measurements of MEMS operating at high speeds has been demonstrated using a new image analysis system. Significant improvements in performa...
Glenn F. LaVigne, Sam L. Miller
ITC
1998
IEEE
104views Hardware» more  ITC 1998»
13 years 11 months ago
Built-in self-test of FPGA interconnect
: We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and shorts among, wiring segments, and also faults affect...
Charles E. Stroud, Sajitha Wijesuriya, Carter Hami...