This paper presents a novel technique to evaluate the noncontrollability measures of state registers for partial scan design. Our model uses implicit techniques for finite state ma...
ABSTRACT - A multiple pass A/D conversion technique is proposed for mixed-signal test applications. Only a single on-chip comparator and sample-and-hold circuit is required to digi...
The ability to make in-situ performance measurements of MEMS operating at high speeds has been demonstrated using a new image analysis system. Significant improvements in performa...
: We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and shorts among, wiring segments, and also faults affect...
Charles E. Stroud, Sajitha Wijesuriya, Carter Hami...