Built-in self-test of FPGA interconnect

: We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and shorts among, wiring segments, and also faults affecting the programmable switches that configure the FPGA interconnect. As a result, the BIST technique provides complete testing of interconnect faults.1

• Type: Conference
• Year: 1998
• Where: ITC
• Authors: Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici
• Keywords: BIST Approach, Hardware, ITC 1998, Method Detects Opens, Programmable Routing Network