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28
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itc 2000
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Low power BIST design by hypergraph partitioning: methodology and architectures
14 years 3 months ago
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dit.upc.es
Patrick Girard, Christian Landrault, Loïs Gui...
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IEEE
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Test program synthesis for path delay faults in microprocessor cores
14 years 3 months ago
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cadlab.ece.ucsb.edu
Wei-Cheng Lai, Angela Krstic, Kwang-Ting Cheng
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IEEE
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A built-in self-repair analyzer (CRESTA) for embedded DRAMs
14 years 3 months ago
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ic.ncue.edu.tw
Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukas...
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IEEE
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Computer-aided fault to defect mapping (CAFDM) for defect diagnosis
14 years 3 months ago
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www.pld.ttu.ee
Zoran Stanojevic, Hari Balachandran, D. M. H. Walk...
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DT
2000
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RT-Level ITC'99 Benchmarks and First ATPG Results
13 years 10 months ago
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www.cercom.polito.it
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
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