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ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper is a technology review of PXI. It describes the basic PXI architecture and looks in more detail at the features of the slot 2 timing and triggering module.