106 search results - page 8 / 22 » itc 2003 |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper presents an approach for analysis of system state differences observable through the scan chain for the debug of functional failures. A novel methodology for Latch Dive...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution o...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
The DFT and Test challenges faced, and the solutions applied, to the ARM1026EJ microprocessor core are described in this paper. New DFT techniques have been created to address the...