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VLSID
2004
IEEE
14 years 11 months ago
2004
IEEE
: The accumulation of popular features in portable products such as mobile handsets is driving battery life to unacceptably low levels. Substantial change will not come from increm...
VLSID
2004
IEEE
14 years 11 months ago
2004
IEEE
Power consumption has become a major design limiter. With the continued reduction of threshold voltages, optimizing leakage energy consumption is becoming increasingly important. ...
VLSID
2004
IEEE
14 years 11 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
VLSID
2004
IEEE
14 years 11 months ago
2004
IEEE
This paper targets at reducing the crosstalk noise closure time by filtering the set of false violations. We propose two approaches to reduce the pessimism in the crosstalk noise ...
VLSID
2004
IEEE
14 years 11 months ago
2004
IEEE
System-on-Chip (SoC) design methodologies rely heavily on reuse of intellectual property (IP) blocks. IP reuse is a labour intensive and time consuming process as IP blocks often ...