Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...
Phil Nigh, David P. Vallett, Atul Patel, Jason Wri...
Design diversity has long been used to protect redundant systems against common-mode failures. The conventional notion of diversity relies on "independent" generation of...
Subhasish Mitra, Nirmal R. Saxena, Edward J. McClu...
A high-level built-in self-test (BIST) synthesis involves several tasks such as system register assignment, interconnection assignment, and BIST register assignment. Existing high...
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
Graham Hetherington, Tony Fryars, Nagesh Tamarapal...