MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Most Hardware Transactional Memory (HTM) implementations choose fixed version and conflict management policies at design time. While eager HTM systems store transactional state in-...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
In a modern chip-multiprocessor system, memory is a shared resource among multiple concurrently executing threads. The memory scheduling algorithm should resolve memory contention...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract--Emerging many-core chip multiprocessors will integrate dozens of small processing cores with an on-chip interconnect consisting of point-to-point links. The interconnect ...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Last-level caches (LLCs) are large structures with significant power requirements. They can be quite inefficient. On average, a cache block in a 2MB LRU-managed LLC is dead 86% of ...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Virtualization has been rapidly expanding its applications in numerous server and desktop environments to improve the utilization and manageability of physical systems. Such prolif...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
As the number of cores and threads in manycore compute accelerators such as Graphics Processing Units (GPU) increases, so does the importance of on-chip interconnection network des...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract--Many shared-memory parallel systems use lockbased synchronization mechanisms to provide mutual exclusion or reader-writer access to memory locations. Software locks are i...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Emerging non-volatile memory technologies such as phase change memory (PCM) promise to increase storage system performance by a wide margin relative to both conventional disks and ...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
We propose an architectural design methodology for designing formally verifiable cache coherence protocols, called Fractal Coherence. Properly designed to be fractal in behavior, t...
MICRO
2010
IEEE
13 years 9 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...