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ET
2007
65views more  ET 2007»
14 years 12 days ago
RF Testing on a Mixed Signal Tester
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global posit...
Dana Brown, John Ferrario, Randy Wolf, Jing Li, Ja...
VTS
2003
IEEE
95views Hardware» more  VTS 2003»
14 years 5 months ago
Built-In Reseeding for Serial Bist
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
Ahmad A. Al-Yamani, Edward J. McCluskey
ITC
2003
IEEE
97views Hardware» more  ITC 2003»
14 years 5 months ago
A Generic Test Path and DUT Model for DataCom ATE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
Jie Sun, Mike Li
DAC
2003
ACM
15 years 1 months ago
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...