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ASPDAC
2010
ACM
135views Hardware» more  ASPDAC 2010»
13 years 9 months ago
Statistical timing verification for transparently latched circuits through structural graph traversal
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...
Xingliang Yuan, Jia Wang
TVLSI
2008
105views more  TVLSI 2008»
13 years 11 months ago
Fast Estimation of Timing Yield Bounds for Process Variations
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
Ruiming Chen, Hai Zhou
DAC
2004
ACM
15 years 15 days ago
First-order incremental block-based statistical timing analysis
Chandramouli Visweswariah, K. Ravindran, K. Kalafa...