In this survey paper we describethe combination of: discretized integral formulations, sparsication techniques, and krylov-subspace based model-order reduction that has led to rob...
The state dependence of leakage can be exploited to obtain modest leakage savings in CMOS circuits. However, one can modify circuits considering state dependence and achieve large...
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...