DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
It is anticipated that self assembled ultra-dense nanomemories will be more susceptible to manufacturing defects and transient faults than conventional CMOS-based memories, thus t...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
The BTnode platform is a versatile and flexible platform for functional prototyping of ad hoc and sensor networks. Based on an Atmel microcontroller, a Bluetooth radio and a low-...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
With the advent of multi-processor systems-on-chip, the interest in process migration is again on the rise both in research and in product development. New challenges associated w...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Recently, the interest about the Tate pairing over binary fields has decreased due to the existence of efficient attacks to the discrete logarithm problem in the subgroups of su...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault d...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
