DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can...
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
Because of its excellent bit-error-rate performance, the Low-Density Parity-Check (LDPC) decoding algorithm is gaining increased attention in communication standards and literatur...
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
The design of ubiquitous and embedded computers focuses on cost factors such as area, power-consumption, and performance. Security and trust properties, on the other hand, are oft...
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
plementation from Abstract Architecture Models Ahmed Amine Jerraya TIMA Laboratory - 46, av. Félix Viallet - 38031 Grenoble – France
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
As the hardware and software complexity grows, it is unlikely for the power management hardware/software to have a full observation of the entire system status. In this paper, we ...
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
Design of low-voltage high-resolution MOSFET-only pipeline analog to digital converters (ADCs) has been investigated in this work. The nonlinearity caused by replacing linear MIM ...
DATE
2007
IEEE
14 years 6 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...