DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Abstract—Building highly optimized embedded systems demands hardware/software (HW/SW) co-design. A key challenge in co-design is the design of HW/SW interfaces, which is often a ...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Abstract—In this paper a programmable Forward Error Correction (FEC) IP for a DVB-S2 receiver is presented. It is composed of a Low-Density Parity Check (LDPC), a Bose-ChaudhuriH...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
— Heat removal and power delivery are two major reliability concerns in the 3D stacked IC technology. Liquid cooling based on micro-fluidic channels is proposed as a viable solu...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
The automated design of SoCs from pre-selected IPs that may require different clocks is challenging because of the following issues. Firstly, protocol mismatches between IPs need ...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
—Intensive research is performed to find post-CMOS technologies. A very promising direction based on reversible logic are quantum computers. While in the domain of reversible lo...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
—Negative Bias Temperature Instability (NBTI) is a significant reliability concern for nanoscale CMOS circuits. Its effects on circuit timing can be especially pronounced for ci...
DATE
2009
IEEE
14 years 6 months ago
2009
IEEE
Abstract— This paper presents a six-transistor (6T) singleended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-Î and low-power embedd...